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Exploring Blob Detection to Determine Atomic Column Positions and Intensities in Time-Resolved TEM Images with Ultra-Low Signal-to-Noise
Microscopy and Microanalysis ( IF 2.9 ) Pub Date : 2022-03-28 , DOI: 10.1017/s1431927622000356 Ramon Manzorro 1 , Yuchen Xu 2 , Joshua L Vincent 1 , Roberto Rivera 3 , David S Matteson 2 , Peter A Crozier 1
中文翻译：
探索斑点检测以确定具有超低信噪比的时间分辨 TEM 图像中的原子柱位置和强度
更新日期：2022-03-28
Microscopy and Microanalysis ( IF 2.9 ) Pub Date : 2022-03-28 , DOI: 10.1017/s1431927622000356 Ramon Manzorro 1 , Yuchen Xu 2 , Joshua L Vincent 1 , Roberto Rivera 3 , David S Matteson 2 , Peter A Crozier 1
Affiliation
中文翻译：
探索斑点检测以确定具有超低信噪比的时间分辨 TEM 图像中的原子柱位置和强度
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