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Preparation and characterization of boron films used for boron-lined gaseous neutron detectors
Journal of the Korean Physical Society ( IF 0.8 ) Pub Date : 2021-08-02 , DOI: 10.1007/s40042-021-00256-2
Chao Deng 1, 2 , Shuming Peng 1 , Xianguo Tuo 1, 2 , Qibiao Wang 2, 3 , Yadong Wu 2, 3 , Fule Liu 4 , Huailiang Li 4 , Jianfeng Cheng 4
Affiliation  

Boron-lined gaseous neutron detectors are being widely used in neutron detection to replace 3He proportional counters, and the boron film’s parameters comprise the key factors influencing the performance of such detectors. However, the method of characterizing boron film is relatively simple at present. In this study, boron films stuck to ultrathin glass substrate with different mass proportions of epoxy to natural boron (MPENBs) were prepared. A variety of characterization methods, including scanning electron microscopy, energy-dispersive X-ray spectroscopy, white-light interferometry, and multiple tape tests, were used to test the boron films simultaneously, and the test results are discussed herein. Moreover, neutron imaging was conducted to analyze the uniformity of boron-10 atoms. These characterization results demonstrate that the optimized MPENB formulation is 0.16 with the boron atomic ratio of chemical elements (ARCE) at approximately 68.8% and surface roughness Sa = 1.457 μm and that the structure of boron film is uniform and fluffy, contributing to improving the boron-lined method.



中文翻译:

用于硼衬里气态中子探测器的硼薄膜的制备和表征

硼衬气态中子探测器正被广泛应用于中子探测以取代3正比计数器和硼膜参数是影响此类探测器性能的关键因素。但目前表征硼膜的方法比较简单。在这项研究中,制备了粘附在超薄玻璃基板上的硼薄膜,其中环氧树脂与天然硼 (MPENB) 的质量比例不同。多种表征方法,包括扫描电子显微镜、能量色散 X 射线光谱、白光干涉法和多次胶带测试,被用于同时测试硼膜,并在此讨论测试结果。此外,还进行了中子成像以分析硼 10 原子的均匀性。这些表征结果表明优化的 MPENB 配方为 0。

更新日期:2021-08-03
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