Crystallography Reports ( IF 0.6 ) Pub Date : 2021-07-23 , DOI: 10.1134/s1063774521040052 V. I. Bondarenko 1 , E. I. Suvorova 1
Abstract
Noise minimization and suppression is one of the most important problems in image processing. Background correction and detection of weak reflections were performed using the well-known algorithms implemented in the ImageJ and Digital Micrograpph (GATAN) programs and developed in this paper for experimental electron diffraction patterns obtained from a nanocrystalline 10-nm-thick hafnium oxide layer. An algorithm for processing electron diffraction patterns is proposed, which is based on a multiscale Retinex filter and Hough transform. It is also devised to present electron diffraction patterns in polar coordinates, which is often more visual and convenient for indexing reflections.
中文翻译:
多晶材料电子衍射图的对比度增强和背景校正方法
摘要
噪声最小化和抑制是图像处理中最重要的问题之一。背景校正和弱反射检测是使用在 ImageJ 和数字显微图 (GATAN) 程序中实现的众所周知的算法进行的,并在本文中开发,用于从 10 纳米厚的纳米晶氧化铪层获得的实验电子衍射图案。提出了一种处理电子衍射图案的算法,该算法基于多尺度 Retinex 滤波器和霍夫变换。它还被设计为在极坐标中呈现电子衍射图案,这通常更直观且便于索引反射。