Abstract
Noise minimization and suppression is one of the most important problems in image processing. Background correction and detection of weak reflections were performed using the well-known algorithms implemented in the ImageJ and Digital Micrograpph (GATAN) programs and developed in this paper for experimental electron diffraction patterns obtained from a nanocrystalline 10-nm-thick hafnium oxide layer. An algorithm for processing electron diffraction patterns is proposed, which is based on a multiscale Retinex filter and Hough transform. It is also devised to present electron diffraction patterns in polar coordinates, which is often more visual and convenient for indexing reflections.
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ACKNOWLEDGMENTS
We are grateful to A.M. Markeev and his group at the Moscow Institute of Physics and Technology for preparing atomic-layer deposited samples.
Funding
This work was supported by the Ministry of Science and Higher Education of the Russian Federation within the State assignment for the Federal Scientific Research Centre “Crystallography and Photonics” of the Russian Academy of Sciences.
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Bondarenko, V.I., Suvorova, E.I. Method of Contrast Enhancement and Background Correction in Electron Diffraction Patterns of Polycrystalline Materials. Crystallogr. Rep. 66, 594–600 (2021). https://doi.org/10.1134/S1063774521040052
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DOI: https://doi.org/10.1134/S1063774521040052