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Analytical Model of an Optoelectronic Probe for Measuring Small Axial Displacements
Optoelectronics, Instrumentation and Data Processing ( IF 0.5 ) Pub Date : 2021-07-12 , DOI: 10.3103/s8756699021010064
A. V. Mineev 1 , V. Kh. Yasoveev 1
Affiliation  

Abstract

A method for measuring displacements based on a logometric method using a branched fiber-optic collector is analyzed. An analytical model of an optical-electronic probe for small axial displacements is developed and key factors influencing the character of the calibration characteristic are determined. The light-energy analysis of the optical scheme of the optoelectronic probe is carried out and the optical loss along the length of the optical path is estimated.



中文翻译:

用于测量小轴向位移的光电探头的解析模型

摘要

分析了一种基于对标法使用分支光纤收集器测量位移的方法。建立了小轴向位移光电探头的解析模型,确定了影响校准特性的关键因素。对光电探头的光学方案进行光能分析,并估计沿光路长度的光损耗。

更新日期:2021-07-12
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