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Analytical Model of an Optoelectronic Probe for Measuring Small Axial Displacements

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Optoelectronics, Instrumentation and Data Processing Aims and scope

Abstract

A method for measuring displacements based on a logometric method using a branched fiber-optic collector is analyzed. An analytical model of an optical-electronic probe for small axial displacements is developed and key factors influencing the character of the calibration characteristic are determined. The light-energy analysis of the optical scheme of the optoelectronic probe is carried out and the optical loss along the length of the optical path is estimated.

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Correspondence to V. Kh. Yasoveev.

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Mineev, A.V., Yasoveev, V.K. Analytical Model of an Optoelectronic Probe for Measuring Small Axial Displacements. Optoelectron.Instrument.Proc. 57, 70–79 (2021). https://doi.org/10.3103/S8756699021010064

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  • DOI: https://doi.org/10.3103/S8756699021010064

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