In this work, we address a low-cost test of switched capacitors filters embedded in configurable analog sections. The proposal improves the Transient Analysis Method (TRAM) by incorporating a similarity measure, dynamic time warping. In this way, we extend TRAM to cases that that initially were not compatible and simplify the test of filters of order higher than two. This paper performs the test evaluation by developing a new simulation model of the addressed system that supports fault injection and simulation. A comparison with experimental data in both normal and faulty behavior validates the model. We consider catastrophic faults in the switches (stuck at open and short) and capacitors (shorts and opens), and deviation faults in the capacitors. The fault simulation results validate the test proposed here.

在这项工作中，我们解决了嵌入在可配置模拟部分中的开关电容器滤波器的低成本测试。该提案通过结合相似性度量、动态时间扭曲来改进瞬态分析方法 (TRAM)。通过这种方式，我们将 TRAM 扩展到最初不兼容的情况，并简化了对高于二阶滤波器的测试。本文通过开发支持故障注入和仿真的寻址系统的新仿真模型来进行测试评估。与正常和错误行为的实验数据的比较验证了该模型。我们考虑了开关（卡在开路和短路）和电容器（短路和开路）中的灾难性故障，以及电容器中的偏差故障。故障模拟结果验证了这里提出的测试。