Abstract

The results of modeling heat propagation processes in the four-layer SiO₂/W/FeSb₂/W detection pixel of thermoelectric single-photon detector after absorbing more than one IR photon are presented. The calculations were carried out by a three-dimensional matrix method for partial differential equations. The cases of both simultaneous absorption of several photons on a 1-μm segment of the absorber surface and the absorption of photons following with a certain time delay are investigated. It is shown that the decay time of the detector signal to the background value substantially depends on the number of simultaneously absorbed photons. Using this parameter, you can determine the number of absorbed photons up to eight. The SiO₂/W/FeSb₂/W detection pixel can also register photons following with a time delay of 5 fs, which corresponds to a counting rate of 2 × 10¹⁴ Hz. A detector with such characteristics is in demand in many areas of modern technology.

中文翻译：

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热电单光子探测器的SiO 2 / W / FeSb 2 / W检测像素中吸收的光子数的确定

摘要

给出了在热电单光子探测器的四层SiO ₂ / W / FeSb ₂ / W探测器像素中吸收多个红外光子后传热过程的模拟结果。对于偏微分方程，通过三维矩阵方法进行了计算。研究了在吸收体表面的1μm区段上同时吸收几个光子和在一定时间延迟后同时吸收光子的情况。示出了检测器信号到背景值的衰减时间基本上取决于同时吸收的光子的数量。使用此参数，可以确定最多吸收八个光子。SiO ₂ / W / FeSb ₂/ W检测像素还可以在5 fs的时间延迟后跟随光子，这对应于2×10 ¹⁴ Hz的计数率。在现代技术的许多领域中都需要具有这种特性的检测器。