The time evolution of the thermally activated decay rates is considered. This evolution is of particular importance for the recent nanoscale experiments discussed in the literature, where the potential barrier is relatively low (or the temperature is relatively high). The single-molecule pulling is one example of such experiments. The decay process is modeled in the present work through computer solving the stochastic (Langevin) equations. Altogether about a hundred of high precision rates have been obtained and analyzed. The rates are registered at the absorption point located far beyond the barrier to exclude the influence of the backscattering on the value of the quasistationary decay rate. The transient time, i.e., the time lapse during which the rate attains half of its quasistationary value, has been extracted. The dependence of the transient times upon a damping parameter is compared with that of the inverse quasistationary decay rate. Two analytical formulae approximating the time-dependences of the numerical rates are proposed and analyzed.

考虑了热激活衰减率的时间演化。对于潜在势垒相对较低（或温度相对较高）的文献中讨论的最近的纳米级实验，这种演变尤为重要。单分子拉动就是这种实验的一个例子。在本工作中，通过计算机求解随机（Langevin）方程来对衰减过程进行建模。总共已经获得并分析了大约一百种高精度。速率在远离障碍的吸收点处记录，以排除反向散射对准静态衰减率值的影响。提取了瞬态时间，即速率达到准静态值一半的时间流逝。将瞬态时间对阻尼参数的依赖性与准静态衰减率的逆相关性进行了比较。提出并分析了近似数值速率随时间变化的两个解析公式。