Simple thermal evaporation technique has been used to prepare Pb-doped ZnO nanotube films on Si (100) substrate. X-ray photoelectron spectroscopy (XPS) and energy-dispersive X-ray spectroscopy (EDX) characterization have been employed to investigate the element’s contents, which indicates the presence of stoichiometry ZnO nanotube film. The XRD pattern has shown the wurtzite phase of ZnO and polycrystalline structure. Thickness and morphology of the films were explored from the cross sectional of the films and the surface using scanning electron microscopy (SEM) images. SEM images have confirmed the ZnO nanotubes and modifications of the morphology when adding Pb; the recorded images have proved that the diameter of the nanotubes is about 50 nm. However, AFM and SEM images have shown dense structure (without nanotubes) for non-doped ZnO film (Pb = 0 wt.%).

简单的热蒸发技术已被用于在Si（100）衬底上制备掺Pb的ZnO纳米管薄膜。X射线光电子能谱（XPS）和能量色散X射线能谱（EDX）表征已用于研究元素的含量，这表明存在化学计量的ZnO纳米管薄膜。XRD图谱显示了ZnO的纤锌矿相和多晶结构。使用扫描电子显微镜（SEM）图像，从膜的横截面和表面探索膜的厚度和形态。SEM图像证实了添加Pb时ZnO纳米管的形貌改变。记录的图像已经证明纳米管的直径约为50nm。然而，