In this work, we enhance tester-based laser induced techniques to detect defects that cannot be assessed by simple chip power-up and require test cycles to initialize the chip. A statistical resistance variation mapping method is proposed and described. Experimental results will be presented as proof-of-concept.

中文翻译：

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动态电阻变化映射技术隔离缺陷

在这项工作中，我们增强了基于测试仪的激光诱导技术，以检测无法通过简单的芯片加电来评估的缺陷，并且需要测试周期来初始化芯片。提出并描述了一种统计电阻变化映射方法。实验结果将以概念验证的形式呈现。