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Probe Microscopy and Electron-Transport Properties of Thin Mo Epitaxial Films on Sapphire
Technical Physics ( IF 1.1 ) Pub Date : 2020-11-18 , DOI: 10.1134/s1063784220110080 L. A. Fomin , I. V. Malikov , V. A. Berezin , A. V. Chernykh , A. B. Loginov , B. A. Loginov
中文翻译:
蓝宝石上钼外延薄膜的探针显微镜和电子传输性质
更新日期:2020-11-18
Technical Physics ( IF 1.1 ) Pub Date : 2020-11-18 , DOI: 10.1134/s1063784220110080 L. A. Fomin , I. V. Malikov , V. A. Berezin , A. V. Chernykh , A. B. Loginov , B. A. Loginov
Abstract
We have analyzed the surface and electron-transport properties of thin molybdenum epitaxial films. Experimental results are compared with available quantum models of the influence of the film surface relief on their resistance.
中文翻译:
蓝宝石上钼外延薄膜的探针显微镜和电子传输性质
摘要
我们已经分析了钼外延薄膜的表面和电子传输特性。将实验结果与可用的对薄膜表面起伏对其电阻的影响的量子模型进行比较。