A scheme for measuring the reflection spectrum with an accuracy of 10^–3 for a wide spectral region is described. To demonstrate it, the reflection spectra of a GaAs substrate with an antireflection coating and a layer of InGaAsP/InP quantum wells on an InP substrate were obtained.

中文翻译：

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在单光束方案中测量反射光谱

描述了在宽光谱区域中以10 ^–3的精度测量反射光谱的方案。为了证明这一点，获得了具有抗反射涂层的GaAs衬底和在InP衬底上的InGaAsP / InP量子阱层的反射光谱。