Skip to main content
SpringerLink
Log in

Measuring the Reflective Spectra in a One-Beam Scheme

  • GENERAL EXPERIMENTAL TECHNIQUE
  • Published:
Instruments and Experimental Techniques Aims and scope Submit manuscript

Abstract

A scheme for measuring the reflection spectrum with an accuracy of 10–3 for a wide spectral region is described. To demonstrate it, the reflection spectra of a GaAs substrate with an antireflection coating and a layer of InGaAsP/InP quantum wells on an InP substrate were obtained.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1.
Fig. 2.
Fig. 3.
Fig. 4.

Similar content being viewed by others

REFERENCES

  1. Balashov, A.A., Vagin, V.A., Moshkin, B.E., Khoro-khorin, A.I., and Khitrov, O.V., Prib. Tekh. Eksp., 2009, no. 6, p. 143.

  2. Kuvaldin, E.V. and Surin, V.G., Prib. Tekh. Eksp., 1994, no. 4, p. 154.

  3. Sokolov, V.I., Kitai, V.S., Mishakov, G.V., Molchanova, S.I., Panchenko, V.Ya., and Sokolova, I.V., Instrum. Exp. Tech., 2011, vol. 54, no. 1, p. 147. https://doi.org/10.1134/S0020441210061089

    Article  Google Scholar 

  4. Keller, U., Weingarten, K.J., Kärtner, F.X., Kopf, D., Braun, B., Jung, I.D., Fluck, R., Hönninger, C., Matuschek, N., and Aus der Au, J., IEEE J. Sel. Top. Quantum Electron., 1996, vol. 2, p. 435.

    Article  ADS  Google Scholar 

  5. Borisov, G.M., Gol’dort, V.G., Kovalyov, A.A., Ledovskikh, D.V., and Rubtsova, N.N., Instrum. Exp. Tech., 2018, vol. 61 no. 1, pp. 94–98. https://doi.org/10.1134/S0020441218010025

    Article  Google Scholar 

  6. Rubtsova, N.N., Kovalyov, A.A., Ledovskikh, D.V., Preobrazhenskii, V.V., Putyato, M.A., Semyagin, B.R., Kuznetsov, S.A., Pivtsov, V.S., and Semenko, A.V., Laser Phys., 2020, vol. 30, p. 025001. https://doi.org/10.1088/1555-6611/ab5946

    Article  ADS  Google Scholar 

  7. Strong, J., Procedures in Experimental Physics, Englewood Cliffs, NJ: Prentice Hall, 1938, p. 376.

    Google Scholar 

  8. Bennett, H.E. and Koehler, W.F., J. Opt. Soc. Am., 1960, vol. 50, p. 1. https://doi.org/10.1063/1.1145344

    Article  ADS  Google Scholar 

Download references

Funding

This study was supported by the Russian Foundation for Basic Research (project no. 18-29-20007).

Author information

Authors and Affiliations

  1. Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, 630090, Novosibirsk, Russia

    A. A. Kovalyov

Authors
  1. A. A. Kovalyov
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to A. A. Kovalyov.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Kovalyov, A.A. Measuring the Reflective Spectra in a One-Beam Scheme. Instrum Exp Tech 63, 842–845 (2020). https://doi.org/10.1134/S0020441220060093

Download citation

  • Received:

  • Revised:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S0020441220060093

Search

Navigation