Several fault models are introduced for efficiently identifying the faults in the reversible circuits, where some of the fault models are borrowed from the conventional circuits. In this work, we consider the Missing Gate Fault Model (MGF) which is specifically used for reversible circuits. The proposed work provides a scheme for generating the complete test set for detecting the single and any number of consecutive multiple missing gate faults in k -CNOT based reversible circuits. The complete test set generation method is twofold. First, a local test pattern is applied to each level of k -CNOT gates and the reverse simulation method is used for identifying all the possible Single Missing Gate Faults (SMGFs). Second, using the complete test set for SMGFs and based on the structure of the k -CNOT based circuit, a test set is formulated. The generated test set is capable of detecting all the MMGFs and as well as the SMGFs in reversible circuits. However, the generated complete test set is not minimal. For achieving the minimality, a table is constructed covering row and column faults and an integer linear programming (ILP) problem is formulated to achieve the minimality of the test set. The experimental results demonstrate that the size of the generated minimized test set is smaller or similar as compared to the existing methods and attains 100% fault coverage.

中文翻译：

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可逆电路中多个缺栅故障的高效测试集构建方案

为了有效地识别可逆电路中的故障，引入了几种故障模型，其中一些故障模型是从常规电路中借用的。在这项工作中，我们考虑了专门用于可逆电路的缺失门故障模型 (MGF)。所提出的工作提供了一种生成完整测试集的方案，用于检测基于 k-CNOT 的可逆电路中的单个和任意数量的连续多个缺失门故障。完整的测试集生成方法是双重的。首先，将局部测试模式应用于 k -CNOT 门的每一级，并使用反向模拟方法识别所有可能的单缺失门故障 (SMGF)。其次，使用完整的 SMGF 测试集，并基于 k-CNOT 电路的结构，制定了测试集。生成的测试集能够检测可逆电路中的所有 MMGF 以及 SMGF。然而，生成的完整测试集并不是最小的。为了实现最小化，构建了一个覆盖行和列故障的表，并制定了整数线性规划 (ILP) 问题来实现测试集的最小化。实验结果表明，与现有方法相比，生成的最小化测试集的大小更小或相似，并达到了 100% 的故障覆盖率。构建一个涵盖行和列故障的表，并制定整数线性规划 (ILP) 问题以实现测试集的最小化。实验结果表明，与现有方法相比，生成的最小化测试集的大小更小或相似，并达到了 100% 的故障覆盖率。构建一个涵盖行和列故障的表，并制定整数线性规划 (ILP) 问题以实现测试集的最小化。实验结果表明，与现有方法相比，生成的最小化测试集的大小更小或相似，并达到了 100% 的故障覆盖率。