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An Efficient Test Set Construction Scheme for Multiple Missing-Gate Faults in Reversible Circuits

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Abstract

Several fault models are introduced for efficiently identifying the faults in the reversible circuits, where some of the fault models are borrowed from the conventional circuits. In this work, we consider the Missing Gate Fault Model (MGF) which is specifically used for reversible circuits. The proposed work provides a scheme for generating the complete test set for detecting the single and any number of consecutive multiple missing gate faults in k-CNOT based reversible circuits. The complete test set generation method is twofold. First, a local test pattern is applied to each level of k-CNOT gates and the reverse simulation method is used for identifying all the possible Single Missing Gate Faults (SMGFs). Second, using the complete test set for SMGFs and based on the structure of the k-CNOT based circuit, a test set is formulated. The generated test set is capable of detecting all the MMGFs and as well as the SMGFs in reversible circuits. However, the generated complete test set is not minimal. For achieving the minimality, a table is constructed covering row and column faults and an integer linear programming (ILP) problem is formulated to achieve the minimality of the test set. The experimental results demonstrate that the size of the generated minimized test set is smaller or similar as compared to the existing methods and attains 100% fault coverage.

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Authors and Affiliations

  1. Department of CSE, Indian Institute of Technology, Guwahati (IITG), Guwahati, Assam, 781039, India

    Mousum Handique & Jantindra Kumar Deka

  2. Department of EECS, Indian Institute of Technology, Bhilai, India

    Santosh Biswas

Authors
  1. Mousum Handique
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  2. Jantindra Kumar Deka
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  3. Santosh Biswas
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Correspondence to Mousum Handique.

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Responsible Editor: B. B. Bhattacharya

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Handique, M., Deka, J.K. & Biswas, S. An Efficient Test Set Construction Scheme for Multiple Missing-Gate Faults in Reversible Circuits. J Electron Test 36, 105–122 (2020). https://doi.org/10.1007/s10836-020-05855-8

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