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Theoretical Explanation of the Effect of a Decrease in the Si(111) Plasmon Energy during the Implantation of Ions with a Large Dose
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2020-08-25 , DOI: 10.1134/s102745102004031x A. S. Rysbaev , J. B. Khujaniyozov , M. T. Normuradov , A. K. Tashatov , B. D. Igamov , S. T. Abraeva
中文翻译:
大剂量离子注入过程中Si(111)等离子体能量下降影响的理论解释
更新日期:2020-08-25
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2020-08-25 , DOI: 10.1134/s102745102004031x A. S. Rysbaev , J. B. Khujaniyozov , M. T. Normuradov , A. K. Tashatov , B. D. Igamov , S. T. Abraeva
Abstract
Theoretical explanation of the experimentally discovered effect of a decrease in the excitation energy of surface and volume plasma oscillations of valence Si (111) electrons during the implantation of Ba and alkaline-element ions with a large dose of D > 1016 cm–2 is presented in this paper. On the basis of a two-fluid model of the electron gas, the observed effect of a decrease in the Si(111) plasmon energy is explained by the strong damping of valence electron oscillations because of disordering of the Si(111) crystal structure up to full amorphization.中文翻译:
大剂量离子注入过程中Si(111)等离子体能量下降影响的理论解释