PbS films in undoped state and with various Eu contents (1 wt.%, 3 wt.%, and 5 wt.%) have been coated effectively on insulating glass substrates by a nebulized spray pyrolysis route. The effects of Eu doping on various properties including the photosensitivity of the PbS films were systematically analyzed. X-ray diffraction (XRD) analysis of the materials revealed a polycrystalline nature with crystallites showing simple cubic structure oriented along (200) direction. Based on the XRD data, the crystallite size, dislocation density, and lattice strain of the films with different doping concentrations were calculated and are consistently discussed. The secondary phase Eu₃O₄ formed when the Eu doping level was higher in the host solution. The Raman peaks detected at 190 cm⁻¹, 236 cm⁻¹, and 465 cm⁻¹ confirmed formation of PbS. Scanning electron microscopy was used to reveal the morphology of the films as a function of the dopant concentration. Important optical properties including the bandgap, absorption coefficient, dielectric constant, index of refraction, and coefficient of extinction of the films are systematically reported. Optical study of the films revealed a variation of the bandgap from 2.14 eV to 2.81 eV with increasing Eu doping level. The 3 wt.% europium-doped PbS film showed better photosensitivity at 100 W/m² compared with the other films based on current–voltage (I–V) measurements.

通过雾化喷雾热解路线，在未掺杂状态下具有各种Eu含量（1 wt。％，3 wt。％和5 wt。％）的PbS膜已有效地涂覆在绝缘玻璃基板上。系统地分析了Eu掺杂对PbS薄膜光敏性等各种性能的影响。材料的X射线衍射（XRD）分析显示多晶性质，微晶显示出沿（200）方向取向的简单立方结构。根据XRD数据，计算并讨论了掺杂浓度不同的薄膜的微晶尺寸，位错密度和晶格应变。当主体溶液中的Eu掺杂水平较高时，形成第二相Eu ₃ O ₄。在190厘米处检测到拉曼峰^-1，236厘米^-1，和465厘米^-1证实形成的PBS中。扫描电子显微镜用于揭示薄膜的形态随掺杂剂浓度的变化。系统地报道了重要的光学性质，包括带隙，吸收系数，介电常数，折射率和消光系数。薄膜的光学研究表明，随着Eu掺杂水平的提高，带隙从2.14 eV到2.81 eV变化。该3重量％的铕掺杂的PbS膜在100瓦/米显示出更好的光敏性²与基于电流-电压（其他的膜相比，我- V测量）。