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Contribution of Lattice Defects to the Intensity of Quasi-Forbidden X-ray Reflections of Diamond: Comparison of X-Ray Topography and Infrared Spectroscopy Data
JETP Letters ( IF 1.4 ) Pub Date : 2020-07-14 , DOI: 10.1134/s002136402009009x
A. A. Shiryaev , D. A. Zolotov , E. M. Suprun , I. G. Dyachkova , S. A. Ivakhnenko , V. E. Asadchikov

New developments of application of X-ray topography in the quasi-forbidden (222) reflection from perfect crystals with diamond lattice to investigate defects are presented. The spatial distribution of intensities of (111) and (222) X-ray reflections is correlated with the distribution of point defects in synthetic diamonds of various types. It is shown that X-ray topography in the quasi-forbidden (222) reflection is a promising tool for investigation of weak stress fields in perfect crystals.

中文翻译:

晶格缺陷对钻石的准禁止X射线反射强度的贡献:X射线形貌和红外光谱数据的比较

提出了X射线形貌在具有金刚石晶格的完美晶体的准禁忌(222)反射中研究缺陷的新进展。(111)和(222)X射线反射强度的空间分布与各种类型的人造钻石中点缺陷的分布相关。结果表明,准禁区(222)反射的X射线形貌是研究理想晶体中弱应力场的有前途的工具。
更新日期:2020-07-14
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