Abstract
New developments of application of X-ray topography in the quasi-forbidden (222) reflection from perfect crystals with diamond lattice to investigate defects are presented. The spatial distribution of intensities of (111) and (222) X-ray reflections is correlated with the distribution of point defects in synthetic diamonds of various types. It is shown that X-ray topography in the quasi-forbidden (222) reflection is a promising tool for investigation of weak stress fields in perfect crystals.
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Funding
This work was supported by the Ministry of Science and Higher Education. FTIR measurements were supported by the State Assignment for the Institute of Geology of Ore Deposits, Petrography, Mineralogy, and Geochemistry, task no. 0136-2019-0012. X-ray measurements were supported by the State Assignment for FSRC Crystallography and Photonics.
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Russian Text © The Author(s), 2020, published in Pis’ma v Zhurnal Eksperimental’noi i Teoreticheskoi Fiziki, 2020, Vol. 111, No. 9, pp. 597–601.
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Shiryaev, A.A., Zolotov, D.A., Suprun, E.M. et al. Contribution of Lattice Defects to the Intensity of Quasi-Forbidden X-ray Reflections of Diamond: Comparison of X-Ray Topography and Infrared Spectroscopy Data. Jetp Lett. 111, 489–493 (2020). https://doi.org/10.1134/S002136402009009X
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DOI: https://doi.org/10.1134/S002136402009009X