Work temperature is a factor, which has a strong influence on the work of a semiconductor electronic element. Operation of an electronic element in an excessive temperature causes the element not to work correctly. For this reason, monitoring the temperature of the element is necessary. One of the methods, which allows the monitoring of electronic element temperature is thermography. This non-contact method can also be used during the operation of the electronic element. The reading of a thermal camera depends on several factors. One of these factors is the sharpness of the registered thermograms. For this reason, research was carried out to develop a simple tool that allows a clear classification of thermograms of electronic elements into sharp and unsharp thermograms. In the research carried-out, the sharpness of the registered thermograms of electronic elements was determined by different sharpness measures. In the research, it was shown that in the case of thermograms classified as sharp, a smaller error of temperature measurement was obtained with the use of a thermal imaging camera.

中文翻译：

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电子元件热成像诊断中的热分析图不清晰

工作温度是一个因素，对半导体电子元件的工作有很大的影响。电子元件在过高的温度下运行会导致该元件无法正常工作。因此，需要监视元件的温度。热成像是允许监视电子元件温度的一种方法。这种非接触方法也可以在电子元件的操作过程中使用。热像仪的读数取决于几个因素。这些因素之一是记录的热分析图的清晰度。因此，进行了研究以开发一种简单的工具，该工具可以将电子元件的热分析图清晰地分为清晰和不清晰的热分析图。在研究开展中，电子元件记录的热分析图的清晰度由不同的清晰度度量确定。在研究中表明，在将热谱图分类为尖峰的情况下，使用热像仪可获得较小的温度测量误差。