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In Situ Electron Diffraction Investigation of Solid State Synthesis of Co-In2O3 Ferromagnetic Nanocomposite Thin Films
JOM ( IF 2.1 ) Pub Date : 2019-11-20 , DOI: 10.1007/s11837-019-03919-5
Liudmila E. Bykova , Sergey M. Zharkov , Victor G. Myagkov , Victor S. Zhigalov , Gennady S. Patrin

In situ electron diffraction was used to study structural transformations during the formation of Co-In2O3 ferromagnetic nanocomposite thin films in a thermite reaction of In/Co3O4 bilayer thin films. Heating was performed from room temperature to 600°C at a rate of 4°C/min, while simultaneously electron diffraction patterns were recorded at a speed of 4 frames/min. This made it possible to determine the initiation, 185°C, and finishing, 550°C, temperatures of the solid-state synthesis, as well as the change in the phase composition during the thermite reaction. The synthesized Co-In2O3 film nanocomposite contained ferromagnetic cobalt nanoclusters surrounded by an In2O3 layer, with an average size of 20 nm, and had a magnetization of 400 emu/cm3 and a coercivity of 50 Oe at room temperature. The estimate of the effective interdiffusion coefficient of the reaction suggests that the main mechanism for the formation of the Co-In2O3 nanocomposite is diffusion along the grain boundaries and dislocations.

中文翻译:

Co-In2O3 铁磁纳米复合薄膜固态合成的原位电子衍射研究

原位电子衍射用于研究在 In/Co3O4 双层薄膜的铝热反应中 Co-In2O3 铁磁纳米复合薄膜形成过程中的结构转变。以4°C/min的速率从室温加热到600°C,同时以4帧/min的速度记录电子衍射图。这使得可以确定固态合成的起始温度 185°C 和结束温度 550°C,以及铝热剂反应过程中相组成的变化。合成的 Co-In2O3 薄膜纳米复合材料包含被 In2O3 层包围的铁磁性钴纳米团簇,平均尺寸为 20 nm,室温下磁化强度为 400 emu/cm3,矫顽力为 50 Oe。
更新日期:2019-11-20
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