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Damage evolution of PµLSE additive-manufactured micro-lattice metastructures: Synchrotron radiation 3D tomography image-based analysis
Science China Physics, Mechanics & Astronomy ( IF 6.4 ) Pub Date : 2020-05-12 , DOI: 10.1007/s11433-019-1522-4
QingLiang Zeng , WenWang Wu , WenXia Hu , Li Xi , Ran Tao , DaiNing Fang

The manufacturing of additives with projection micro litho stereo exposure (PµLSE) has provided an opportunity for the fabrication of metastructures with complex microstructures at micro-nano resolutions. However, the performance evaluation of as-fabricated metastructures is challenging. The benefit of synchrotron radiation-based 3D imaging techniques and advanced image processing methods makes it is feasible to study fabrication defects and damage processes of micro-nanoscale body-centered cubic (BCC) lattices manufactured with PµLSE. First, synchrotron radiation technology is used to capture the structural features inside the micro-lattice samples. Subsequently, several types of statistical defects-based image finite element models are adopted to analyze the failure process of the structure under compression loading. Finally, comparisons between in situ experiments and numerical simulation results are performed for verification. The method of the combined non-destructive testing of synchrotron radiation and image finite element technology provides a robust technique for evaluating the performances of additive-manufactured micro-lattice with complex microstructures.

中文翻译:

PµLSE增材制造的微晶格元结构的损伤演化:基于同步辐射3D层析成像的图像分析

具有投影微光刻立体曝光(PµLSE)的添加剂制造为以微纳米分辨率制造具有复杂微结构的元结构提供了机会。但是,对加工后的元结构的性能评估具有挑战性。基于同步辐射的3D成像技术和先进的图像处理方法的优势,使得研究用PµLSE制造的微纳米尺度的以人体为中心的立方(BCC)晶格的制造缺陷和损伤过程变得可行。首先,同步辐射技术用于捕获微晶格样品内部的结构特征。随后,采用几种基于统计缺陷的图像有限元模型来分析结构在压缩载荷作用下的破坏过程。最后,之间的比较进行现场实验和数值模拟结果进行验证。同步加速器辐射与图像有限元技术相结合的无损检测方法为评估具有复杂微结构的加成制造微晶格的性能提供了可靠的技术。
更新日期:2020-05-12
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