The advent of X-pinch based compact radiographs has significantly expanded the application field of pulsed radiography for diagnostics of fast processes. The key point here is the spatial resolution which these radiographs can provide. The method for determining the size of the soft x-ray (SXR) source based on diffraction imaging of opaque metallic wires and their comparison with the diffraction pattern calculated for an extended source in a given spectral range is presented in the paper. The X-pinch source sizes have been measured taking into account the sensitometric characteristic of the film and the scanner characteristics. By this method it has been shown that the diameter of the X-pinch radiation source for current rise rates in the range 0.7–1.35 kA/ns varies slightly for the spectral range hv >3 keV.

中文翻译：

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基于X-Pinch的软X射线源尺寸研究

基于 X-pinch 的紧凑型射线照相的出现显着扩展了脉冲射线照相在快速过程诊断中的应用领域。这里的关键点是这些射线照片可以提供的空间分辨率。本文介绍了基于不透明金属线的衍射成像确定软 x 射线 (SXR) 源尺寸的方法，并将它们与在给定光谱范围内为扩展源计算的衍射图进行比较。考虑到胶片的感光特性和扫描仪特性，已测量 X 收缩源尺寸。通过这种方法已经表明，对于 0.7-1.35 kA/ns 范围内的电流上升速率，X 收缩辐射源的直径在光谱范围 hv > 3 keV 内略有变化。