Abstract

A unified analytical technology based on the integration of scanning probe nanotomography and optical microscopy (SPNT–OM) is presented, and the potential of the technology is demonstrated by the example of a multiparameter analysis of encoded microspheres. The presented SPNT–OM technology can become a powerful tool for multimodal nanocharacterization of a wide range of microparticles, composites, and hybrid polymers.

中文翻译：

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聚合物微球的形态，光学和磁性结构的纳米级关联分析，用于多重诊断

摘要

提出了一种基于扫描探针纳米断层扫描和光学显微镜（SPNT-OM）集成的统一分析技术，并通过对编码微球的多参数分析示例证明了该技术的潜力。提出的SPNT-OM技术可以成为用于多种微粒，复合材料和杂化聚合物的多峰纳米表征的强大工具。