At the intersection of spectroscopy and microscopy lie techniques that are capable of providing subnanometer imaging of excited states of individual molecules or nanoparticles. Such approaches are particularly important for imaging macromolecules or nanoparticles large enough to have a high probability of containing a defect. These inevitable defects often control properties and function despite an otherwise ideal structure. We discuss real-space imaging techniques such as using scanning tunneling microscopy tips to enhance optical measurements and electron energy-loss spectroscopy in a scanning transmission electron microscope, which is based on focused electron beams to obtain high-resolution spatial information on excited states. The outlook for these methods is bright, as they will provide critical information for the characterization and improvement of energy-switching, electron-switching, and energy-harvesting materials.

中文翻译：

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亚纳米尺度上单个粒子的激发态成像。

在光谱学和显微技术的交叉点上，能够提供亚纳米级成像的单个分子或纳米粒子的激发态的技术。这样的方法对于成像大分子或纳米颗粒足够大以具有包含缺陷的高可能性的可能性特别重要。尽管存在理想的结构，但这些不可避免的缺陷通常会控制性能和功能。我们讨论了现实空间成像技术，例如使用扫描隧道显微镜尖端来增强光学测量和扫描透射电子显微镜中的电子能量损失谱，该电子显微镜基于聚焦电子束以获得有关激发态的高分辨率空间信息。这些方法的前景光明，