Unfortunately, after publication of this article [1], it was noticed that the name of the fifth author was incorrectly displayed as Jakob Schiøz. The correct name is Jakob Schiøtz and can be seen in the corrected author list above. The original article has also been updated to correct this error.

中文翻译：

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校正至：纳米粒子的透射电子显微镜图像的表面应变测量精度。

不幸的是，在发表本文[1]之后，注意到第五位作者的名字被错误地显示为JakobSchiøz。正确的名称是JakobSchiøtz，可以在上面的更正作者列表中看到。原始文章也已更新，可以更正此错误。