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Correction to: Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles

Advanced Structural and Chemical Imaging volume 3, Article number: 16 (2017) Cite this article

The Original Article was published on 25 October 2017

Correction to: Adv Struct Chem Imag (2017) 3:14 https://doi.org/10.1186/s40679-017-0047-0

Unfortunately, after publication of this article [1], it was noticed that the name of the fifth author was incorrectly displayed as Jakob Schiøz. The correct name is Jakob Schiøtz and can be seen in the corrected author list above. The original article has also been updated to correct this error.

Reference

  1. Madsen, J., Liu, P., Wagner, J.B., Hansen, T.W., Schiøtz, J.: Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles. Adv Struct Chem Imag. 3, 14 (2017). https://doi.org/10.1186/s40679-017-0047-0

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Authors and Affiliations

  1. Department of Physics, Technical University of Denmark, Fysikvej, Building 311, 2800, Kongens Lyngby, Denmark

    Jacob Madsen & Jakob Schiøtz

  2. Center for Electron Nanoscopy, Technical University of Denmark, Fysikvej, Building 311, 2800, Kongens Lyngby, Denmark

    Pei Liu, Jakob B. Wagner & Thomas W. Hansen

Authors
  1. Jacob Madsen
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  2. Pei Liu
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  3. Jakob B. Wagner
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  4. Thomas W. Hansen
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  5. Jakob Schiøtz
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Corresponding author

Correspondence to Jacob Madsen.

Additional information

The original article can be found online at https://doi.org/10.1186/s40679-017-0047-0.

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Open Access This article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.

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Madsen, J., Liu, P., Wagner, J.B. et al. Correction to: Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles. Adv Struct Chem Imag 3, 16 (2017). https://doi.org/10.1186/s40679-017-0049-y

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  • DOI: https://doi.org/10.1186/s40679-017-0049-y