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Decreased 8-oxoguanine DNA glycosylase 1 (hOGG1) expression and DNA oxidation damage induced by Cr (VI)
Chemico-Biological Interactions ( IF 4.7 ) Pub Date : 2018-11-27 , DOI: 10.1016/j.cbi.2018.11.019
Hailing Xia , Shibo Ying , Lingfang Feng , Haiming Wang , Chunji Yao , Tao Li , Yixiao Zhang , Sanjun Fu , Donger Ding , Xinnian Guo , Yan Tong , Xiaofeng Wang , Zhijian Chen , Zhaoqiang Jiang , Xing Zhang , Bernardo Lemos , Jianlin Lou

Occupational exposure to Cr (VI) can cause DNA damage, genetic instability and elevate the risk of cancer. Here we investigated Cr (VI)-induced DNA damage and 8-oxoguanine DNA glycosylase 1 (hOGG1) gene expression in electroplating workers. The hOGG1 gene encodes a DNA repair enzyme that is crucial in DNA oxidation damage repair. Deficiency in hOGG1 DNA repair capacity contributes to the accumulation of DNA damage and genetic instability. To address the issues, we collected peripheral blood samples and urine samples from 162 electroplating workers and 84 control subjects. We measured blood chromium levels, urine chromium levels, DNA damage, and hOGG1 mRNA expression. We found significantly higher levels of blood chromium, urine chromium, and DNA damage in electroplating workers compared with controls, whereas mRNA levels of the hOGG1 gene were significantly lower in the exposed workers. Furthermore, in electroplating workers we found that blood Cr had a positive association with DNA damage as measured with the tail DNA%. Meanwhile, tail DNA% was positively associated with hOGG1 mRNA expression. Finally, the effect of potassium dichromate treatment was investigated in a human B lymphoblastoid cell line (LCL). We observed that potassium dichromate induced a concentration-dependent decrease in hOGG1 mRNA. After removing the K2Cr2O7-containing medium for 3 days and 7 days, the abundance of hOGG1 mRNA expression recovered to a similar level as the controls. Collectively, our findings suggest that decreased hOGG1 mRNA expression in occupationally exposed populations partially contribute to Cr (VI) induced DNA damage.



中文翻译:

Cr(VI)诱导的8-氧代鸟嘌呤DNA糖基化酶1(hOGG1)表达降低和DNA氧化损伤

职业接触六价铬会导致DNA损伤,遗传不稳定并增加患癌症的风险。在这里,我们研究了六价铬(VI)诱导的DNA损伤和电镀工人中的8-氧鸟嘌呤DNA糖基化酶1(hOGG1)基因表达。hOGG1基因编码一种DNA修复酶,该酶在DNA氧化损伤修复中至关重要。hOGG1 DNA修复能力的不足会导致DNA损伤的积累和遗传不稳定。为了解决这些问题,我们收集了162名电镀工人和84名对照受试者的外周血和尿液样本。我们测量了血铬水平,尿铬水平,DNA损伤和hOGG1 mRNA表达。我们发现与对照组相比,电镀工人的血液铬,尿液铬和DNA损伤水平明显更高,而在暴露的工人中,hOGG1基因的mRNA水平则显着降低。此外,在电镀工人中,我们发现血液中的Cr与DNA损伤呈正相关,以尾部DNA%来衡量。同时,尾巴DNA%与hOGG1 mRNA表达呈正相关。最后,在人B淋巴母细胞系(LCL)中研究了重铬酸钾处理的效果。我们观察到重铬酸钾诱导hOGG1 mRNA的浓度依赖性降低。移除K后 在人B淋巴母细胞系(LCL)中研究了重铬酸钾治疗的效果。我们观察到重铬酸钾诱导hOGG1 mRNA的浓度依赖性降低。移除K后 在人B淋巴母细胞系(LCL)中研究了重铬酸钾治疗的效果。我们观察到重铬酸钾诱导hOGG1 mRNA的浓度依赖性降低。移除K后含有2 Cr 2 O 7的培养基中放置3天和7天后,hOGG1 mRNA表达的丰度恢复到与对照组相似的水平。总的来说,我们的发现表明,在职业暴露人群中,hOGG1 mRNA表达的下降部分地导致了Cr(VI)诱导的DNA损伤。

更新日期:2018-11-27
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