The combination of inelastic electron tunneling spectroscopy (IETS), also used for IET spectrum based on scanning tunneling microscopy with atomic force microscopy (AFM) enables us to measure the vibrational energies of a single molecule along with the force exerted by the tip of a microscope, which deepens our understanding on the interaction between the tip and the molecule on a surface. The resolution of IETS is a crucial factor in determining the vibrational energies of a molecule. However, radio frequency (RF) noise from the environment significantly deteriorates the resolution. We introduce an RF noise filtering technique, which enables high resolution IETS while maintaining uncompromised AFM performance, demonstrated by vibrational measurements of a CO molecule on a copper surface.

中文翻译：

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用于增强扫描隧道和原子力组合显微镜中非弹性电子隧道光谱分辨率的射频滤波器

非弹性电子隧道光谱 (IETS) 的组合，也用于基于扫描隧道显微镜和原子力显微镜 (AFM) 的 IET 光谱，使我们能够测量单个分子的振动能以及显微镜尖端施加的力，这加深了我们对尖端与表面分子之间相互作用的理解。IETS 的分辨率是决定分子振动能的关键因素。然而，来自环境的射频 (RF) 噪声会显着降低分辨率。我们引入了一种 RF 噪声过滤技术，该技术可实现高分辨率 IETS，同时保持不妥协的 AFM 性能，通过对铜表面上的 CO 分子进行振动测量来证明。