Abstract Due to matrix effects and limitations in the calibration process for direct analysis of solids, the search for different calibration approaches is very important. This study is aimed to Nd determination in high-performance magnets from hard disk using direct solid analysis by wavelength dispersive X-ray fluorescence. Three univariate calibration methods were evaluated: multi-energy calibration, one-point gravimetric standard addition and two-point calibration transfer. These strategies employ an efficient matrix-matching method, minimizing the matrix effects related to the direct analysis of solids. The trueness values were calculated according to reference concentration by inductively coupled plasma optical emission spectrometry and the concentration obtained by univariate models. For almost all samples, the trueness values were within an acceptable range from 80 to 120%. Besides that, relative standard deviation values ranged from 3 to 27% for all cases and, the standard error ranged from 2 to 6% w w−1 Nd among the calibration methods. These parameters show the potential of these alternative calibration methods over traditional ones.

中文翻译：

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使用不同的波长色散 X 射线荧光校准方法测定硬盘磁体中的钕

摘要 由于基质效应和固体直接分析校准过程的局限性，寻找不同的校准方法非常重要。本研究旨在使用波长色散 X 射线荧光直接固体分析法测定硬盘中高性能磁体中的 Nd。评估了三种单变量校准方法：多能量校准、单点重量标准添加和两点校准转移。这些策略采用有效的基质匹配方法，最大限度地减少与固体直接分析相关的基质效应。根据电感耦合等离子体发射光谱法的参考浓度和单变量模型获得的浓度计算真实度值。对于几乎所有的样本，正确度值在 80% 到 120% 的可接受范围内。除此之外，所有情况下的相对标准偏差值范围为 3% 至 27%，校准方法中的标准误差范围为 2% 至 6% ww-1 Nd。这些参数显示了这些替代校准方法相对于传统校准方法的潜力。