Information on the composition, morphology, and thickness of surface oxide scale helps to control the performance of heat-resistant alloys. Currently, there is a lack of adequate analytical methods that allow the rapid and nondestructive evaluation of these properties. In this study, we demonstrate a nondestructive method for identifying silica (SiO 2 ) scale and evaluating its morphology and thickness within 1 min by acquiring the cathodoluminescence (CL) images and spectra of SiO 2 scale on an Fe–5%Si alloy heated to 900 °C. SiO 2 scale emitted yellow–orange, violet, or red luminescence, whereas the other scale products that form on Fe–Si alloys, such as FeO, Fe 3 O 4 , Fe 2 O 3 , and Fe 2 SiO 4 , did not. Thus, we can identify SiO 2 scale and observe its morphology on the basis of luminescent color in the CL image. The thickness of SiO 2 scale can be correlated to the intensity of the CL peak at 645 nm. Therefore, the acquisition of CL images and spectra is a novel analytical method, which allows one to control the performance of SiO 2 -forming Fe–Si alloys.

中文翻译：

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阴极发光分析对铁基合金上的二氧化硅氧化皮进行无损评估

表面氧化皮的成分、形态和厚度信息有助于控制耐热合金的性能。目前，缺乏足够的分析方法来快速和无损地评估这些特性。在本研究中，我们展示了一种通过在加热至 200 ℃的 Fe-5%Si 合金上获取阴极发光 (CL) 图像和 SiO 2 鳞片光谱，在 1 分钟内识别二氧化硅 (SiO 2 ) 鳞片并评估其形态和厚度的无损方法。 900℃。SiO 2 水垢发出黄橙色、紫色或红色发光，而在 Fe-Si 合金上形成的其他水垢产物，如 FeO、Fe 3 O 4 、Fe 2 O 3 和 Fe 2 SiO 4 则没有。因此，我们可以根据 CL 图像中的发光颜色来识别 SiO 2 尺度并观察其形态。SiO 2 鳞片的厚度可以与645 nm处的CL峰的强度相关。因此，CL 图像和光谱的获取是一种新的分析方法，可以控制形成 SiO 2 的 Fe-Si 合金的性能。