当前位置: X-MOL 学术Micron › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Estimation of systematic errors committed when approximating length of grain boundaries using edges of rectangular or hexagonal grids of EBSD maps.
Micron ( IF 2.5 ) Pub Date : 2019-12-19 , DOI: 10.1016/j.micron.2019.102812
Piotr Bobrowski 1
Affiliation  

A method for calculating the overestimation error of grain boundary (GB) length committed when approximating a straight segment of a GB using edges of rectangular or hexagonal grid was given. The relative errors range from 0 % to 41.42 % and from 15.47 % to 33.33 %, for the square and hex grids, respectively. The average error values for both kinds of meshes are the same, namely, 27.32 %. Comparison of the mathematical calculations with experimental results obtained from Electron Backscatter Diffraction (EBSD) data, indicated that the values of the average overestimation errors may be utilized as correction coefficients to adjust experimental data towards more accurate numbers.



中文翻译:

当使用EBSD图的矩形或六边形网格的边缘来估计晶粒边界长度时,会发生系统误差。

给出了一种计算使用矩形或六边形网格的边缘逼近GB的直线段时所产生的晶界(GB)长度的高估误差的方法。对于正方形和十六进制网格,相对误差的范围分别为0%至41.42%和15.47%至33.33%。两种网格的平均误差值相同,即27.32%。将数学计算与从电子反向散射衍射(EBSD)数据获得的实验结果进行比较,结果表明,平均高估误差的值可以用作校正系数,以将实验数据调整为更准确的数字。

更新日期:2019-12-19
down
wechat
bug