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Electron compton scattering and the measurement of electron momentum distributions in solids
Journal of Microscopy ( IF 1.5 ) Pub Date : 2020-01-06 , DOI: 10.1111/jmi.12854
A Talmantaite 1 , M R C Hunt 1 , B G Mendis 1
Affiliation  

Summary Electron Compton scattering is a technique that gives information on the electron momentum density of states and is used to characterize the ground state electronic structure in solids. Extracting the momentum density of states requires us to assume the so‐called ‘impulse approximation’, which is valid for large energy losses. Here, the robustness of the impulse approximation in the low energy transfer regime is tested and confirmed on amorphous carbon films. Compared to traditional Compton measurements, this provides additional benefits of more efficient data collection and a simplified way to probe valence electrons, which govern solid state bonding. However, a potential complication is the increased background from the plasmon signal. To overcome this, a novel plasmon background subtraction routine is proposed for samples that are resistant to beam damage. Lay Description Properties of solids depend on their electronic structure which can be studied using electron Compton scattering technique. Here, an electron beam is used to penetrate a very thin sample. During the interaction between the electrons in the beam and electrons in the sample, the former transfer a part of their energy to the latter, resulting in a measurable energy loss of the transmitted beam. The amount of the energy transfer depends on the angle of incidence between the beam and the sample. Typically, the experiments are carried out using high tilt angles and high energy transfer; however, in this work, we show that even smaller angles of incidence are suitable, which improve the signal quality and ease data processing procedures.

中文翻译:

电子康普顿散射和固体中电子动量分布的测量

总结 电子康普顿散射是一种提供状态的电子动量密度信息的技术,用于表征固体中的基态电子结构。提取状态的动量密度需要我们假设所谓的“脉冲近似”,这对于大的能量损失是有效的。在这里,在无定形碳膜上测试并确认了低能量转移机制中脉冲近似的稳健性。与传统的康普顿测量相比,这提供了更有效的数据收集和探测价电子的简化方法的额外好处,价电子控制着固态键合。然而,潜在的并发症是来自等离子体信号的背景增加。为了克服这一点,提出了一种新的等离子体背景减法程序,用于抵抗光束损伤的样品。层 描述 固体的性质取决于它们的电子结构,可以使用电子康普顿散射技术进行研究。在这里,电子束用于穿透非常薄的样品。在光束中的电子与样品中的电子相互作用期间,前者将其部分能量转移给后者,从而导致透射光束的可测量能量损失。能量转移的量取决于光束和样品之间的入射角。通常,实验使用高倾斜角和高能量转移进行;然而,在这项工作中,我们表明甚至更小的入射角也是合适的,
更新日期:2020-01-06
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