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HAADF-STEM Image Resolution Enhancement Using High-Quality Image Reconstruction Techniques: Case of the Fe3O4(111) Surface
Microscopy and Microanalysis ( IF 2.9 ) Pub Date : 2019-08-13 , DOI: 10.1017/s1431927619014788
G Bárcena-González 1 , M P Guerrero-Lebrero 1 , E Guerrero 1 , A Yañez 1 , B Nuñez-Moraleda 1 , D Kepaptsoglou 2, 3 , V K Lazarov 2 , P L Galindo 1
Affiliation  

From simple averaging to more sophisticated registration and restoration strategies, such as super-resolution (SR), there exist different computational techniques that use a series of images of the same object to generate enhanced images where noise and other distortions have been reduced. In this work, we provide qualitative and quantitative measurements of this enhancement for high-angle annular dark-field scanning transmission electron microscopy imaging. These images are compared in two ways, qualitatively through visual inspection in real and reciprocal space, and quantitatively, through the calculation of objective measurements, such as signal-to-noise ratio and atom column roundness. Results show that these techniques improve the quality of the images. In this paper, we use an SR methodology that allows us to take advantage of the information present in the image frames and to reliably facilitate the analysis of more difficult regions of interest in experimental images, such as surfaces and interfaces. By acquiring a series of cross-sectional experimental images of magnetite (Fe3O4) thin films (111), we have generated interpolated images using averaging and SR, and reconstructed the atomic structure of the very top surface layer that consists of a full monolayer of Fe, with topmost Fe atoms in tetrahedrally coordinated sites.

中文翻译:

使用高质量图像重建技术提高 HAADF-STEM 图像分辨率:以 Fe3O4(111) 表面为例

从简单的平均到更复杂的配准和恢复策略,例如超分辨率 (SR),存在不同的计算技术,它们使用同一对象的一系列图像来生成增强的图像,其中噪声和其他失真已经减少。在这项工作中,我们为高角度环形暗场扫描透射电子显微镜成像提供了这种增强的定性和定量测量。这些图像通过两种方式进行比较,一种是通过在实空间和倒数空间中的目测进行定性比较,另一种是通过计算客观测量值(例如信噪比和原子柱圆度)进行定量。结果表明,这些技术提高了图像的质量。在本文中,我们使用 SR 方法,使我们能够利用图像帧中存在的信息,并可靠地促进对实验图像中更困难的感兴趣区域的分析,例如表面和界面。通过获取磁铁矿(Fe34) 薄膜 (111),我们使用平均和 SR 生成了插值图像,并重建了由全单层 Fe 组成的最顶层表面层的原子结构,最顶层的 Fe 原子位于四面体配位位置。
更新日期:2019-08-13
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