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Study on factors influencing the edge slope of infrared absorption of CdZnTe crystal
Materials Science in Semiconductor Processing ( IF 4.2 ) Pub Date : 2020-03-01 , DOI: 10.1016/j.mssp.2019.104871
Shijin Liang , Shiwen Sun , Changhe Zhou , Chao Xu , Jiahua Min , Xiaoyan Liang , Jijun Zhang , Chengwei Jin , Haozhi Shi , Linjun Wang , Yue Shen

Abstract When the composition of some P-type Cd0.96Zn0.04Te (CZT) crystals grown by the vertical Bridgman method (VB) is analyzed by component mapping spectrometer. It is observed that the short-wave (800–1000 nm) infrared absorption edge is inclined, accompanied by a decreased long-wave (400-4000 cm−1) infrared transmittance, which leads to an apparent interference of Zn component mapping measurement. In our research, effects of roughness, surface composition, and internal defects on the absorption edge slope of CZT (hereinafter referred to as the edge slope) were investigated by AFM, EDX, XPS and PICTS, and the main cause of non-uniformity of the slope mapping was obtained from annealing treatment. The results indicated that compared with the surface roughness and surface composition due to our surface treatment process, the dominant defect (Cd vacancy) in CZT was the principal influence factor for the edge slope, whose value was negatively correlated with the defect concentration. Furthermore, the inclination of the edge slope and the simultaneous decrease of long-wave infrared transmittance could be respectively explained by the tail state effect and the free carrier absorption caused by high-concentration Cd vacancy absorption. The mapping distribution trend of the slope presented consistency with that of the long-wave transmittance. In addition, the non-uniformity distribution of the edge slope mapping, can be effectively improved by adequate annealing under Cd atmosphere. Steep slopes and a monotonous distribution of Zn content was observed after annealing.

中文翻译:

CdZnTe晶体红外吸收边缘斜率影响因素研究

摘要 对垂直布里奇曼法(VB)生长的一些P型Cd0.96Zn0.04Te(CZT)晶体的成分进行了成分映射分析。观察到短波(800-1000 nm)红外吸收边倾斜,伴随长波(400-4000 cm-1)红外透射率降低,导致Zn组分映射测量出现明显干扰。在我们的研究中,通过 AFM、EDX、XPS 和 PICTS 研究了粗糙度、表面成分和内部缺陷对 CZT 吸收边缘斜率(以下简称边缘斜率)的影响,以及导致 CZT 吸收边缘斜率不均匀的主要原因。斜率图是通过退火处理获得的。结果表明,与我们的表面处理工艺导致的表面粗糙度和表面成分相比,CZT中的主要缺陷(Cd空位)是边缘斜率的主要影响因素,其值与缺陷浓度呈负相关。此外,边缘斜率的倾斜和长波红外透射率的同时降低可以分别用尾态效应和高浓度Cd空位吸收引起的自由载流子吸收来解释。斜率的映射分布趋势与长波透射率的映射分布趋势一致。此外,边缘斜率映射的不均匀分布,可以通过在 Cd 气氛下充分退火来有效改善。退火后观察到陡峭的斜率和单调的锌含量分布。其值与缺陷浓度呈负相关。此外,边缘斜率的倾斜和长波红外透射率的同时降低可以分别用尾态效应和高浓度Cd空位吸收引起的自由载流子吸收来解释。斜率的映射分布趋势与长波透射率的映射分布趋势一致。此外,边缘斜率映射的不均匀分布,可以通过在 Cd 气氛下充分退火来有效改善。退火后观察到陡峭的斜率和单调的锌含量分布。其值与缺陷浓度呈负相关。此外,边缘斜率的倾斜和长波红外透射率的同时降低可以分别用尾态效应和高浓度Cd空位吸收引起的自由载流子吸收来解释。斜率的映射分布趋势与长波透射率的映射分布趋势一致。此外,边缘斜率映射的不均匀分布,可以通过在 Cd 气氛下充分退火来有效改善。退火后观察到陡峭的斜率和单调的锌含量分布。边缘斜率的倾斜和长波红外透射率的同时降低可以分别用尾态效应和高浓度Cd空位吸收引起的自由载流子吸收来解释。斜率的映射分布趋势与长波透射率的映射分布趋势一致。此外,边缘斜率映射的不均匀分布,可以通过在 Cd 气氛下充分退火来有效改善。退火后观察到陡峭的斜率和单调的锌含量分布。边缘斜率的倾斜和长波红外透射率的同时降低可以分别用尾态效应和高浓度Cd空位吸收引起的自由载流子吸收来解释。斜率的映射分布趋势与长波透射率的映射分布趋势一致。此外,边缘斜率映射的不均匀分布,可以通过在 Cd 气氛下充分退火来有效改善。退火后观察到陡峭的斜率和单调的锌含量分布。可以通过在 Cd 气氛下充分退火来有效改善。退火后观察到陡峭的斜率和单调的锌含量分布。可以通过在 Cd 气氛下充分退火来有效改善。退火后观察到陡峭的斜率和单调的锌含量分布。
更新日期:2020-03-01
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