Photonic crystals are widely used in sensors, lasers, optical wavelength filters, and dispersion compensations used in optical communication networks. We propose to exploit the defect modes of one-dimensional ternary photonic crystals based on silicon, analyte, and silica layers for a refractive index sensor. The defect modes are created by inserting an analyte layer in the middle of the structure between two adjacent silica and silicon layers. Exploiting the defect modes in the transmission spectrum leads to hypersensitivity. The results show that the thicknesses of the layers and defect part are, respectively, about 155, 700, 155, and 1200 nm in optimum conditions. Our optimum structure is about 11 µm long, and sensitivity of this structure is more than 450 nm/RIU and 600 nm/RIU for the perpendicular light incident and incident angle of 45°, respectively. The effect of dispersion is investigated on the sensor operation, too. Numerical simulations exhibit that sensitivity is decreased to 410 nm/RIU for incident perpendicular rays. Also, the optimum thickness of the defect layer is changed significantly when considering the dispersion effects, so dispersion plays a significant role in the proposed sensor.

中文翻译：

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一维三元色散光子晶体中基于缺陷模式的高灵敏度折光传感器的设计与仿真

光子晶体广泛用于传感器，激光器，光学波长滤波器和光通信网络中使用的色散补偿。我们建议利用基于硅，分析物和二氧化硅层的一维三元光子晶体的缺陷模式作为折射率传感器。缺陷模式是通过在两个相邻的二氧化硅和硅层之间的结构中间插入分析物层而产生的。利用透射光谱中的缺陷模式会导致超敏反应。结果表明，在最佳条件下，层和缺陷部分的厚度分别为约155、700、155和1200nm。我们的最佳结构约为11 µm长，对于垂直入射光和45°入射角，该结构的灵敏度超过450 nm / RIU和600 nm / RIU，分别。还研究了分散对传感器操作的影响。数值模拟表明，对于入射的垂直射线，灵敏度降低到410 nm / RIU。同样，当考虑色散效应时，缺陷层的最佳厚度会显着变化，因此色散在提出的传感器中起着重要的作用。