An amorphous metal (a-metal) TEM specimen suitable for measuring the information envelop of (S)TEM electron microscopes is presented. Its features include producing high angle electron scattering intensities and having good structural stability compared with commonly used specimens of amorphous carbon (a-C) and Au islands supported on a-C substrate.

中文翻译：

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高角度散射，稳定的非晶态金属TEM样品，用于测量电子显微镜的信息包络。

提出了一种适合于测量（S）TEM电子显微镜信息包络的非晶态金属（a-metal）TEM标本。与通常使用的非晶碳（aC）和支撑在aC基板上的Au岛的样品相比，其特征包括产生高角度电子散射强度并具有良好的结构稳定性。