Abstract Transmission electron microscopy (TEM) is used to study dislocations, but image stresses introduced during sample preparation may induce slip, potentially significantly modifying the microstructure. The present study quantifies these effects by simulating sample preparation in Al, Fe, Mg, and Zr using dislocation dynamics. Significant decreases in total density are seen, which average nearly 40% for all four metals. The extent of microstructure loss during sample preparation depends on crystal orientation in the HCP systems, and also exhibits substantial statistical variations between cases.

中文翻译：

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使用透射电子显微镜量化大块金属中的位错密度

摘要 透射电子显微镜 (TEM) 用于研究位错，但在样品制备过程中引入的图像应力可能会导致滑移，从而显着改变微观结构。本研究通过使用位错动力学模拟 Al、Fe、Mg 和 Zr 的样品制备来量化这些影响。可以看到总密度显着下降，所有四种金属的平均密度接近 40%。样品制备过程中微观结构损失的程度取决于 HCP 系统中的晶体取向，并且在不同情况下也表现出很大的统计差异。