Computational electrodynamics modelling plays an important role in understanding and designing new photonic devices. The results offered by these simulations are usually close‐range field distributions or angular power emission plots. We describe a procedure to compute the optical microscopy image from simulated far‐field scattering data using three‐dimensional discrete Fourier transforms that can be used when the simulation software package do not include proper far‐field to optical imaging projection routines. The method is demonstrated comparing simulated images with real images of nanowires obtained with a total internal reflection microscope.

中文翻译：

---

一种从远场散射数值数据模拟光学图像的方法及其在金属纳米线全内反射显微镜中的应用

计算电动力学建模在理解和设计新光子器件方面发挥着重要作用。这些模拟提供的结果通常是近距离场分布或角功率发射图。我们描述了使用三维离散傅立叶变换从模拟远场散射数据计算光学显微镜图像的程序，当模拟软件包不包括适当的远场到光学成像投影例程时，可以使用该程序。通过将模拟图像与使用全内反射显微镜获得的纳米线的真实图像进行比较，证明了该方法。