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An Ultracompact GRIN‐Lens‐Based Spot Size Converter using Subwavelength Grating Metamaterials
Laser & Photonics Reviews ( IF 9.8 ) Pub Date : 2019-09-23 , DOI: 10.1002/lpor.201900172
José Manuel Luque‐González 1 , Robert Halir 1 , Juan Gonzalo Wangüemert‐Pérez 1 , José de‐Oliva‐Rubio 1 , Jens H. Schmid 2 , Pavel Cheben 2 , Íñigo Molina‐Fernández 1 , Alejandro Ortega‐Moñux 1
Affiliation  

Graded‐index materials offer virtually complete control over light propagation in integrated photonic chips but can be challenging to implement. Here, an anisotropic graded‐index metamaterial, synthesized with fully etched silicon subwavelength structures, is proposed. Based on this material, a spot size converter that expands the transverse electric (TE) mode field profile from a 0.5 µm wide silicon wire waveguide to a 15 µm wide waveguide within a length of only 14 µm is designed. Measured insertion losses are below 1 dB in an unprecedented 130 nm bandwidth, limited by the measurement setup, with full 3D finite‐difference time‐domain (FDTD) simulations predicting a bandwidth in excess of 300 nm. Furthermore, the device is well suited to feed fiber‐to‐chip grating couplers, while requiring a footprint ten times smaller than conventional adiabatic tapers.

中文翻译:

使用亚波长光栅超材料的超紧凑型基于GRIN透镜的光斑尺寸转换器

渐变折射率材料几乎可以完全控制集成光子芯片中的光传播,但实施起来可能会遇到挑战。在这里,提出了一种各向异性的梯度折射率超材料,该材料由完全蚀刻的硅亚波长结构合成。基于这种材料,设计了一种光点尺寸转换器,该转换器可以在仅14 µm的长度内将横向电(TE)模式场分布从0.5 µm宽的硅线波导扩展到15 µm宽的波导。在史无前例的130 nm带宽中,测量的插入损耗低于1 dB,受测量设置的限制,而完整的3D有限差分时域(FDTD)模拟预测的带宽将超过300 nm。此外,该设备非常适合于馈入光纤到芯片的光栅耦合器,
更新日期:2019-09-23
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