We review all the published literature and show that there is no experimental evidence for homogeneous tin titanate SnTiO₃ in bulk or thin-film form. Instead a combination of unrelated artefacts are easily misinterpreted. The X-ray Bragg data are contaminated by double scattering from the Si substrate, giving a strong line at the 2-theta angle exactly where perovskite SnTiO₃ should appear. The strong dielectric divergence near 560K is irreversible and arises from oxygen site detrapping, accompanied by Warburg/Randles interfacial anomalies. The small (4 μC/cm²) apparent ferroelectric hysteresis remains in samples shown to be pure (Sn,Ti)O₂ rutile/cassiterite, in which ferroelectricity is forbidden. Only very recent work reveals real bulk SnTiO3_{, but it possesses an ilmenite-like structure with an elaborate array of stacking faults, not suitable for ferroelectric devices. Unpublished TEM data reveal an inhomogeneous SnO layered structured thin films, related to shell-core structures. The harsh conclusion is that there is a combination of unrelated artefacts masquerading as ferroelectricity in powders and ALD films; and only a trace of a second phase in PLD film data suggests any perovskite content at all. The fact that X-ray, dielectric, and hysteresis data all lead to the wrong conclusion is instructive and reminds us of earlier work on copper calcium titanate (a well-known boundary-layer capacitor).}

中文翻译：

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钛酸锡——寻找新的铁电钙钛矿

我们回顾了所有已发表的文献，并表明没有实验证据表明均质钛酸锡 SnTiO ₃呈块状或薄膜形式。相反，不相关的人工制品的组合很容易被误解。X 射线布拉格数据受到来自 Si 衬底的双重散射的污染，在钙钛矿 SnTiO ₃应出现的 2 θ角处给出强线。560K 附近的强介电发散是不可逆的，它是由氧位点脱离引起的，伴随着 Warburg/Randles 界面异常。小的 (4 μC/cm ² ) 表观铁电滞后保留在显示为纯 (Sn,Ti)O _{2 的}样品中金红石/锡石，其中禁止铁电。只有最近的工作才揭示了真正的块状 SnTiO3 _{，但它具有类似钛铁矿的结构，具有精心设计的堆垛层错阵列，不适用于铁电器件。未发表的 TEM 数据揭示了与壳核结构相关的不均匀 SnO 层状结构薄膜。严酷的结论是，在粉末和 ALD 薄膜中存在伪装成铁电性的无关人工制品的组合；并且在 PLD 薄膜数据中只有一丝第二相表明钙钛矿含量根本不存在。X 射线、电介质和磁滞数据都导致错误结论的事实具有指导意义，并提醒我们早期对钛酸铜钙（一种著名的边界层电容器）的研究。}