Glass and mineral corrosion usually leads to the formation of morphologically and compositionally complex surface layers that can be characterized by various analytical techniques to infer rate control mechanisms. In this study, we investigate the capabilities and limitations of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to better understand chemical processes of glass corrosion. In particular, we focus on the potential impact of the ToF-SIMS ion beam on the distribution of several elements of interest in alteration layers formed on International Simple Glass, a six-oxide reference glass altered in a solution enriched in alkalis and spiked with H₂¹⁸O. A thin flake of glass partially altered on both sides is analyzed entirely from one side to the other to determine whether atoms weakly bonded to the solid are displaced by the beams. We highlight the beam effect on cations weakly bonded to the silicate network (Li, Na, K, and B, Ca, Cs to a lesser extent) affecting the profile shape of these elements. No impact is observed on ¹⁸O and H, but it is demonstrated that quantification of isotopic ratios is possible only for a limited range of isotopic enrichment.

玻璃和矿物腐蚀通常会导致形成形态和成分复杂的表面层，这些表面层可以通过各种分析技术来表征，以推断速率控制机制。在这项研究中，我们调查飞行时间二次离子质谱（ToF-SIMS）的功能和局限性，以更好地了解玻璃腐蚀的化学过程。特别是，我们着眼于ToF-SIMS离子束对在国际简单玻璃上形成的蚀变层中感兴趣的几种元素的分布的潜在影响，这是一种六氧化物参比玻璃，在富含碱的溶液中进行了蚀变，并掺有H ₂ ¹⁸O.从一侧到另一侧完全分析了两面都部分改变的薄玻璃片，以确定是否弱耦合到固体的原子被光束置换了。我们重点介绍了对弱结合到硅酸盐网络上的阳离子（Li，Na，K和B，Ca，Cs程度较小）上的离子束的影响，这些阳离子会影响这些元素的轮廓形状。没有观察到对¹⁸ O和H的影响，但是证明了同位素比率的定量仅对于有限范围的同位素富集是可能的。