Chiral structure determination of single-walled carbon nanotube (SWNT), including its handedness and chiral index (n,m), has been regarded as an intractable issue for both fundamental research and practical application. For a given SWNT, the n and m values can be conveniently deduced if an arbitrary two of its three crucial structural parameters, that is, diameter d, chiral angle θ, and electron transition energy E_ii, are obtained. Here, we have demonstrated a novel approach to derive the (n,m) indices from the θ, d, and E_ii of SWNTs. Handedness and θ were quickly measured based on the chirality-dependent alignment of SWNTs on graphite surface. By combining their measured d and E_ii, (n,m) indices of SWNTs can be independently and uniquely identified from the (θ,d) or (θ,E_ii) plots, respectively. This approach offers intense practical merits of high-efficiency, low-cost, and simplicity.

中文翻译：

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石墨表面排列的单壁碳纳米管的手性结构测定

单壁碳纳米管（SWNT）的手性结构测定，包括其手性和手性指数（n，m），已被认为是基础研究和实际应用都难以解决的问题。对于给定的SWNT，如果获得其三个关键结构参数中的任意两个，即直径d，手性角θ和电子跃迁能E _ii，则可以方便地推导出n和m值。在这里，我们展示了一种从θ，d和E _ii导出（n，m）指数的新颖方法。的SWNT。基于SWNT在石墨表面上的手性依赖性排列，可以快速测量手感和θ。通过组合其测得的d和E _ii，可以分别从（θ，d）或（θ，E _ii）图中独立和唯一地标识SWNT的（n，m）指数。这种方法具有高效，低成本和简单的强大实用价值。