It is demonstrated that Kikuchi features become clearly visible if reflection high-energy electron diffraction (RHEED) patterns are filtered using digital image processing software. The results of such pattern transformations are shown for SrTiO₃ with mixed surface termination for data collected at different azimuths of the incident electron beam. A simplified analytical approach for the theoretical description of filtered Kikuchi patterns is proposed and discussed. Some examples of raw and filtered patterns for thin films are shown. RHEED patterns may be treated as a result of coherent and incoherent scattering of electron waves. The effects of coherent scattering may be considered as those occurring due to wave diffraction by an idealized crystal and, usually, only effects of this type are analysed to obtain structural information on samples investigated with the use of RHEED. However, some incoherent scattering effects mostly caused by thermal vibrations of atoms, known as Kikuchi effects, may also be a source of valuable information on the arrangements of atoms near the surface. Typically, for the case of RHEED, Kikuchi features are hidden in the intensity background and researchers cannot easily recognize them. In this paper, it is shown that the visibility of features of this type can be substantially enhanced using computer graphics methods.

中文翻译：

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小角度几何收集的电子衍射图中菊池线的识别

事实证明，如果使用数字图像处理软件过滤反射高能电子衍射 (RHEED) 图案，菊池特征将变得清晰可见。对于在入射电子束的不同方位角收集的数据，显示了具有混合表面终止的SrTiO ₃的这种图案转换的结果。提出并讨论了一种用于过滤菊池模式理论描述的简化分析方法。显示了薄膜的原始图案和过滤图案的一些示例。RHEED 图案可以被视为电子波相干和非相干散射的结果。相干散射效应可以被认为是由于理想化晶体的波衍射而发生的效应，并且通常只分析这种类型的效应，以获得使用 RHEED 研究的样品的结构信息。然而，一些主要由原子热振动引起的非相干散射效应（称为菊池效应）也可能是有关表面附近原子排列的宝贵信息来源。通常，对于 RHEED 来说，菊池特征隐藏在强度背景中，研究人员无法轻易识别它们。本文表明，使用计算机图形方法可以大大增强此类特征的可见性。