Despite the well-established defect tolerance of metal halide perovskites (MHPs), there are multiple sources of defects in MHPs, such as grain boundaries in thin films, colloidal nanocrystal surfaces, and a heterointerface formed with the charge-transport layer, all of which play a crucial role in determining the efficiency and stability of light-emitting diodes (LEDs). Defect passivation strategies have become essential tools for improving device performance. Here, we analyzed and correlated the origins of the defects in MHPs to their influence on the optical and charge-carrier transport properties and systematically reviewed mechanistic principles of promising passivation strategies to either eliminate or suppress various defects that undermine the potential of perovskite LEDs. Several challenges and prospects for the future development of MHP LEDs have been identified. This review could provide a valuable reference for the community to promote the optimization and stabilization for developing high-performance MHP LEDs and further uncover the potential of MHPs for optoelectronic devices.

尽管金属卤化物钙钛矿 (MHP) 具有公认的缺陷耐受性，但 MHP 中存在多种缺陷来源，例如薄膜中的晶界、胶体纳米晶体表面以及与电荷传输层形成的异质界面，所有这些在决定发光二极管 (LED) 的效率和稳定性方面起着至关重要的作用。缺陷钝化策略已成为提高器件性能的重要工具。在这里，我们分析了 MHP 中缺陷的起源与它们对光学和载流子传输特性的影响，并系统地回顾了有前途的钝化策略的机械原理，以消除或抑制破坏钙钛矿 LED 潜力的各种缺陷。已经确定了 MHP LED 未来发展的几个挑战和前景。该综述可以为社区促进开发高性能 MHP LED 的优化和稳定化以及进一步揭示 MHPs 在光电器件中的潜力提供有价值的参考。