Passive surface wave methods are non-invasive, low-cost, and robust approaches to image near-surface shear-wave velocity (Vs) structure using passive seismic sources. A clean and high-resolution dispersion image is critical for surface wave analysis. In practice, however, artifacts or aliasing are almost inevitable in passive surface wave dispersion measurements and seriously pollute the measured dispersion spectra. It is significant to clarify how they are generated, how they affect the dispersion measurement, and how they can be attenuated. We provide the first comprehensive review on artifacts that are frequently observed in high-frequency (>1 Hz) passive surface wave dispersion measurements and summarize them into two general groups: geometry-related artifacts and source-related artifacts. Mathematical derivations and numerical as well as field examples are presented to explain the underlying physics of various artifacts and explore potential solutions and guidelines to attenuate them before and after field observations. This work will help the reader understand the complexity of the measured dispersion spectra and lead to improvements on rapidly advancing passive surface wave methods.

被动面波方法是使用被动地震源对近地表剪切波速度 (Vs) 结构进行成像的非侵入性、低成本且稳健的方法。干净且高分辨率的色散图像对于表面波分析至关重要。然而，在实践中，伪影或混叠在被动表面波色散测量中几乎是不可避免的，并且会严重污染测量的色散光谱。阐明它们是如何产生的、它们如何影响色散测量以及它们如何被衰减是很重要的。我们对在高频 (>1 Hz) 被动表面波色散测量中经常观察到的伪影进行了首次全面审查，并将它们概括为两大类：与几何相关的伪影和与源相关的伪影。提出了数学推导和数值以及现场示例，以解释各种人工制品的基本物理原理，并探索潜在的解决方案和指导方针，以在现场观察前后减弱它们。这项工作将帮助读者了解测量色散光谱的复杂性，并改进快速推进的被动表面波方法。