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Lateral ion migration accelerates degradation in halide perovskite devices
Energy & Environmental Science ( IF 32.4 ) Pub Date : 2022-11-10 , DOI: 10.1039/d2ee02330j
Daniel A. Jacobs 1 , Christian M. Wolff 1 , Xin-Yu Chin 2 , Kerem Artuk 1 , Christophe Ballif 1, 2 , Quentin Jeangros 2
Affiliation  

The migration of mobile ions has long been considered a source of performance degradation in devices based on halide perovskites, but details regarding the mechanisms and extent of this problem remain scarce. Here we report the finding that differences in electrical potential across the plane of the substrate, induced by electrode edges such as the boundaries of the metallization or the transparent conductive oxide, can play a primary role in behaviour and degradation across a wide range of stability tests. In particular, we observe clear signatures of lateral ion migration in solar cells made using both double and triple cation mixed-halide perovskites, with effects induced by reverse-bias stress, illuminated MPP-tracking, and even as a result of time spent in storage. In their mildest form these effects manifest as patterns of modulated photoluminescence intensity around device boundaries that propagate into surrounding regions as a function of applied bias and time. We show that ionic drift-diffusion models provide a convincing match to these patterns, including their voltage dependence. In the context of MPP-tracking, we observe a severe form of material degradation in our solar cells whose spatial distribution and voltage dependence match models of lateral ion migration with high accuracy. We thereby obtain evidence of an ionically-mediated degradation mode which proceeds at a high rate near device boundaries, but is nonetheless also operative throughout the active area. This connection between “bulk” and “boundary” degradation has multiple implications for both the design of perovskite solar cell and LED devices, as well as for the understanding of their characteristic behaviour in long-term stability testing.

中文翻译:

横向离子迁移加速卤化物钙钛矿器件的降解

长期以来,移动离子的迁移一直被认为是基于卤化物钙钛矿的器件性能下降的一个原因,但有关该问题的机制和程度的详细信息仍然很少。在这里,我们报告了这一发现,即由电极边缘(如金属化或透明导电氧化物的边界)引起的基板平面上的电势差异可以在广泛的稳定性测试中对行为和退化起主要作用. 特别是,我们观察到使用双阳离子和三阳离子混合卤化物钙钛矿制成的太阳能电池中横向离子迁移的明显特征,其影响是由反向偏置应力、照明 MPP 跟踪甚至是由于存储时间引起的. 在它们最温和的形式中,这些效应表现为器件边界周围的调制光致发光强度模式,该模式作为施加的偏置和时间的函数传播到周围区域。我们表明,离子漂移扩散模型为这些模式提供了令人信服的匹配,包括它们的电压依赖性。在 MPP 跟踪的背景下,我们在太阳能电池中观察到一种严重的材料退化形式,其空间分布和电压依赖性以高精度匹配横向离子迁移模型。因此,我们获得了离子介导的降解模式的证据,该模式在器件边界附近以高速率进行,但仍然在整个有源区域中有效。
更新日期:2022-11-14
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