A review on radiation-hardened memory cells for space and terrestrial applications,International Journal of Circuit Theory and Applications

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A review on radiation-hardened memory cells for space and terrestrial applications
International Journal of Circuit Theory and Applications ( IF 1.8 ) Pub Date : 2022-09-07 , DOI: 10.1002/cta.3429
Mukku Pavan Kumar ₁ , Rohit Lorenzo ₁

Affiliation

Over the past four decades, single event upset (SEU) and single event multiple node upset (SEMNU) have become the major issues in the memory area. Moreover, these upsets are prone to reliability issues in space, terrestrial, military, and medical applications. This article concisely reviews different researchers and academicians who proposed resilience techniques and methods to mitigate this upset mess. In addition, we also investigated the importance of

◂◽.▸ Q_{C r i t}

and the impact of

◂◽.▸ Q_{C r i t}

on device scaling parameters in upset mechanism, probability of memory failure, and the figure of metrics for the stability of memory cells.

中文翻译：

用于空间和地面应用的抗辐射存储单元综述

在过去的四十年中，单粒子翻转（SEU）和单粒子多节点翻转（SEMNU）已成为存储领域的主要问题。此外，这些干扰在太空、地面、军事和医疗应用中容易出现可靠性问题。本文简要回顾了不同的研究人员和院士，他们提出了弹性技术和方法来缓解这种混乱局面。此外，我们还调查了