A rapid data acquisition and reconstruction method is introduced to image the crystalline structure of materials and the associated strain and orientations at micrometre resolution using Laue diffraction. The method relies on scanning a coded aperture across the diffracted X-ray beam from broadband illumination and a reconstruction algorithm to resolve Laue microdiffraction patterns as a function of depth along the incident illumination path. It provides rapid access to full diffraction information for sub-micrometre volume elements in bulk materials. Both the theory and the experimental validation of this imaging approach are presented.

中文翻译：

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具有编码孔径的深度分辨劳厄微衍射

介绍了一种快速数据采集和重建方法，使用劳厄衍射以微米分辨率对材料的晶体结构以及相关的应变和取向进行成像。该方法依赖于扫描来自宽带照明的衍射 X 射线束的编码孔径和重建算法，以将劳厄微衍射图案解析为沿入射照明路径的深度的函数。它提供了对散装材料中亚微米体积元素的完整衍射信息的快速访问。介绍了这种成像方法的理论和实验验证。